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Keith Baker: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. S. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter
    A Fast Signature Simulation Tool for Built-In Self-Testing Circuits. [Citation Graph (0, 0)][DBLP]
    DAC, 1987, pp:17-25 [Conf]
  2. Ian T. Foster, Jerry Gieraltowski, Scott Gose, Natalia Maltsev, Edward N. May, Alex Rodriguez, Dinanath Sulakhe, A. Vaniachine, Jim Shank, Saul Youssef, David Adams, Richard Baker, Wensheng Deng, Jason Smith, Dantong Yu, Iosif Legrand, Suresh Singh, Conrad Steenberg, Yang Xia, M. Anzar Afaq, Eileen Berman, James Annis, L. A. T. Bauerdick, Michael Ernst, Ian Fisk, Lisa Giacchetti, Gregory E. Graham, Anne Heavey, Joseph Kaiser, Nickolai Kuropatkin, Ruth Pordes, Vijay Sekhri, John Weigand, Yujun Wu, Keith Baker, Lawrence Sorrillo, John Huth, Matthew Allen, Leigh Grundhoefer, John Hicks, Fred Luehring, Steve Peck, Rob Quick, Stephen Simms, George Fekete, Jan vandenBerg, Kihyeon Cho, Kihwan Kwon, Dongchul Son, Hyoungwoo Park, Shane Canon, Keith R. Jackson, David E. Konerding, Jason Lee, Doug Olson, Iowa Sakrejda, Brian Tierney, Mark Green, Russ Miller, James Letts, Terrence Martin, David Bury, Catalin Dumitrescu, Daniel Engh, Robert Gardner, Marco Mambelli, Yuri Smirnov, Jens-S. Vöckler, Michael Wilde, Yong Zhao, Xin Zhao, Paul Avery, Richard Cavanaugh, Bockjoo Kim, Craig Prescott, Jorge Luis Rodriguez, Andrew Zahn, Shawn McKee, Christopher T. Jordan, James E. Prewett, Timothy L. Thomas, Horst Severini, Ben Clifford, Ewa Deelman, Larry Flon, Carl Kesselman, Gaurang Mehta, Nosa Olomu, Karan Vahi, Kaushik De, Patrick McGuigan, Mark Sosebee, Dan Bradley, Peter Couvares, Alan DeSmet, Carey Kireyev, Erik Paulson, Alain Roy, Scott Koranda, Brian Moe, Bobby Brown, Paul Sheldon
    The Grid2003 Production Grid: Principles and Practice. [Citation Graph (0, 0)][DBLP]
    HPDC, 2004, pp:236-245 [Conf]
  3. Keith Baker
    Time-to-Market: An Issue in Mixed-signal vs. Analogue. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:254- [Conf]
  4. Keith Baker
    QTAG: A Standard for Test Fixture Based IDDQ/ISSQ Monitors. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:194-202 [Conf]
  5. Keith Baker
    Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say? [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:299- [Conf]
  6. Keith Baker
    Spice up your life: simulate mixed-signal ICs! [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:1131- [Conf]
  7. Keith Baker
    SIA Roadmaps: Sunset Boulevard for l_DDQ. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1121- [Conf]
  8. Keith Baker, Jos van Beers
    Shmoo Plots - the Black Art of IC Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:932-933 [Conf]
  9. Keith Baker, A. Bratt, Andrew M. D. Richardson, A. Welbers
    Development of a CLASS 1 QTAG Monitor. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:213-222 [Conf]
  10. Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen
    Plug & Play IDDQ Monitoring with QTAG. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:739-749 [Conf]
  11. Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans
    Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:747-756 [Conf]
  12. R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker
    Analogue Fault Simulation Based on Layout-Dependent Fault Models. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:641-649 [Conf]
  13. R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker
    Improving Total IC Design Quality Using Application Mode Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:866-872 [Conf]
  14. Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
    Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:95-104 [Conf]
  15. M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess
    Parameter Monitoring: Advantages and Pitfalls. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:115-124 [Conf]
  16. Prab Varma, Anthony P. Ambler, Keith Baker
    An Analysis of the Economics of Self Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:20-30 [Conf]
  17. Bas Verhelst, Richard Morren, Keith Baker
    Using EDIF for Transfer of Test Data: Practical Experience. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:459-465 [Conf]
  18. Keith Baker, Alan Hales
    Plug-and-Play IDDQ Testing for Test Fixtures. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:3, pp:53-61 [Journal]
  19. Keith Baker, Jos van Beers
    Shmoo Plotting: The Black Art of IC Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:90-97 [Journal]
  20. Keith Baker
    Alvey computer vision and image interpretation research programmes. [Citation Graph (0, 0)][DBLP]
    Image Vision Comput., 1985, v:3, n:4, pp:146-151 [Journal]
  21. Kate Crennell, Keith Baker
    5th Alvey vision Conference. [Citation Graph (0, 0)][DBLP]
    Image Vision Comput., 1990, v:8, n:1, pp:2-3 [Journal]
  22. Paolo Remagnino, Tieniu Tan, Keith Baker
    Multi-agent visual surveillance of dynamic scenes. [Citation Graph (0, 0)][DBLP]
    Image Vision Comput., 1998, v:16, n:8, pp:529-532 [Journal]

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