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Arun Krishnamachary: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham
    Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor. [Citation Graph (0, 0)][DBLP]
    DAC, 1999, pp:647-652 [Conf]
  2. Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri
    A Comprehensive Fault Model for Deep Submicron Digital Circuits. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:360-364 [Conf]
  3. Arun Krishnamachary, Jacob A. Abraham
    Test generation for resistive opens in CMOS. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2002, pp:65-70 [Conf]
  4. Arun Krishnamachary, Jacob A. Abraham
    Effects of Multi-cycle Sensitization on Delay Tests. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2003, pp:137-142 [Conf]
  5. Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri
    Timing Verification and Delay Test Generation for Hierarchical Designs. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2001, pp:157-162 [Conf]

  6. Case Study on Speed Failure Causes in a Microprocessor. [Citation Graph (, )][DBLP]


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