The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
Srikanth Venkataraman: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel
    Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. [Citation Graph (0, 0)][DBLP]
    DAC, 1995, pp:133-138 [Conf]
  2. Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
    Partial Scan Design Based on Circuit State Information. [Citation Graph (0, 0)][DBLP]
    DAC, 1996, pp:807-812 [Conf]
  3. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri
    Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:68-75 [Conf]
  4. Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
    Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:996-1001 [Conf]
  5. Srikanth Venkataraman, W. Kent Fuchs
    A deductive technique for diagnosis of bridging faults. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1997, pp:562-567 [Conf]
  6. Srikanth Venkataraman
    DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:5- [Conf]
  7. Srikanth Venkataraman, Nagesh Nagapalli, Lech Jozwiak
    Quality Driven Manufacturing and SOC Designs. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:5- [Conf]
  8. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy
    Fault Diagnosis and Fault Model Aliasing. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:206-211 [Conf]
  9. M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
    Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:669-678 [Conf]
  10. Ruifeng Guo, Srikanth Venkataraman
    A technique for fault diagnosis of defects in scan chains. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:268-277 [Conf]
  11. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy
    Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:489-497 [Conf]
  12. Srikanth Venkataraman
    Diagnosis meets Physical Failure Analysis: What is needed to succeed?. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1442- [Conf]
  13. Srikanth Venkataraman, Scott Brady Drummonds
    POIROT: a logic fault diagnosis tool and its applications. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:253-262 [Conf]
  14. Srikanth Venkataraman, W. Kent Fuchs
    Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:878-886 [Conf]
  15. David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
    DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:14- [Conf]
  16. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen
    Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:475-480 [Conf]
  17. Srikanth Venkataraman, W. Kent Fuchs
    Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1997, pp:381-387 [Conf]
  18. Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
    Diagnostic Simulation of Sequential Circuits Using Fault Sampling. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1998, pp:476-481 [Conf]
  19. Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
    Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:66-71 [Conf]
  20. Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran
    Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:97-102 [Conf]
  21. Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
    Dominance Based Analysis for Large Volume Production Fail Diagnosis. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:392-399 [Conf]
  22. Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman
    Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:380-385 [Conf]
  23. Ramesh C. Tekumalla, Srikanth Venkataraman, Jayabrata Ghosh-Dastidar
    On Diagnosing Path Delay Faults in an At-Speed Environment. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:28-33 [Conf]
  24. Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs
    Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:58-63 [Conf]
  25. Srikanth Venkataraman, Scott Brady Drummonds
    A Technique for Logic Fault Diagnosis of Interconnect Open Defects. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:313-318 [Conf]
  26. Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs
    Dynamic diagnosis of sequential circuits based on stuck-at faults. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:198-203 [Conf]
  27. Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
    An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:23-30 [Conf]
  28. Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
    Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:351-358 [Conf]
  29. Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
    Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:231-238 [Conf]
  30. Srikanth Venkataraman, Scott Brady Drummonds
    Poirot: Applications of a Logic Fault Diagnosis Tool. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:1, pp:19-30 [Journal]
  31. Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois
    Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1995, v:44, n:2, pp:223-233 [Journal]
  32. Ruifeng Guo, Srikanth Venkataraman
    An algorithmic technique for diagnosis of faulty scan chains. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:9, pp:1861-1868 [Journal]
  33. Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty
    Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2001, v:6, n:4, pp:471-489 [Journal]
  34. Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
    Extraction error modeling and automated model debugging in high-performance custom designs. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2006, v:14, n:7, pp:763-776 [Journal]
  35. Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
    Making Manufacturing Work For You. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:107-108 [Conf]

  36. DFM / DFT / SiliconDebug / Diagnosis. [Citation Graph (, )][DBLP]


  37. Diagnosis of Scan Clock Failures. [Citation Graph (, )][DBLP]


Search in 0.008secs, Finished in 0.009secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002