Search the dblp DataBase

Publications of Author

1. Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel
   Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. [Citation Graph (0, 0)][DBLP]
   DAC, 1995, pp:133-138 [Conf]
   
2. Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
   Fault Diagnosis Using State Information. [Citation Graph (0, 0)][DBLP]
   FTCS, 1996, pp:96-103 [Conf]
   
3. Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
   Identification of unsettable flip-flops for partial scan and faster ATPG. [Citation Graph (0, 0)][DBLP]
   ICCAD, 1996, pp:63-66 [Conf]
   
4. Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
   Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis. [Citation Graph (0, 0)][DBLP]
   ITC, 1996, pp:294-302 [Conf]
   
5. David B. Lavo, Brian Chess, Tracy Larrabee, Ismed Hartanto
   Probabilistic mixed-model fault diagnosis. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:1084-1093 [Conf]
   
6. David B. Lavo, Ismed Hartanto, Tracy Larrabee
   Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:250-259 [Conf]
   
7. Peter C. Maxwell, Ismed Hartanto, Lee Bentz
   Comparing functional and structural tests. [Citation Graph (0, 0)][DBLP]
   ITC, 2000, pp:400-407 [Conf]
   
8. Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
   Characterization and Implicit Identification of Sequential Indistinguishability. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 1997, pp:376-380 [Conf]
   
9. Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs
   Full fault dictionary storage based on labeled tree encoding. [Citation Graph (0, 0)][DBLP]
   VTS, 1996, pp:174-179 [Conf]
   
10. Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs
    Diagnostic Test Pattern Generation for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:196-202 [Conf]
    
11. Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs
    Dynamic diagnosis of sequential circuits based on stuck-at faults. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:198-203 [Conf]
    
12. Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty
    Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2001, v:6, n:4, pp:471-489 [Journal]