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Bart Vermeulen:
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Publications of Author
- Bart Vermeulen, Mohammad Z. Urfianto, Sandeep Kumar Goel
Automatic generation of breakpoint hardware for silicon debug. [Citation Graph (0, 0)][DBLP] DAC, 2004, pp:514-517 [Conf]
- Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller
Creating Value Through Test. [Citation Graph (0, 0)][DBLP] DATE, 2003, pp:10402-10409 [Conf]
- Sandeep Kumar Goel, Bart Vermeulen
Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:1103-1110 [Conf]
- Henk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen
Optimal Interconnect ATPG Under a Ground-Bounce Constraint. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:369-378 [Conf]
- Gert-Jan van Rootselaar, Bart Vermeulen
Silicon debug: scan chains alone are not enough. [Citation Graph (0, 0)][DBLP] ITC, 1999, pp:892-902 [Conf]
- Bart Vermeulen
TAPS All Over My Chips! So Now What Do I Do? [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:1190- [Conf]
- Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
Trends in Testing Integrated Circuits. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:688-697 [Conf]
- Bart Vermeulen, Steven Oostdijk, Frank Bouwman
Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. [Citation Graph (0, 0)][DBLP] ITC, 2001, pp:121-130 [Conf]
- Bart Vermeulen, Tom Waayers, Sjaak Bakker
EEE 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:55-63 [Conf]
- Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel
Core-Based Scan Architecture for Silicon Debug. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:638-647 [Conf]
- Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? [Citation Graph (0, 0)][DBLP] VTS, 2002, pp:445-446 [Conf]
- Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts
Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2003, v:20, n:2, pp:8-18 [Journal]
- Bart Vermeulen, Sandeep Kumar Goel
Design for Debug: Catching Design Errors in Digital Chips. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2002, v:19, n:3, pp:37-45 [Journal]
- Bart Vermeulen, Kees Goossens, Remco van Steeden, Martijn T. Bennebroek
Communication-Centric SoC Debug Using Transactions. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2007, pp:69-76 [Conf]
- Kees Goossens, Bart Vermeulen, Remco van Steeden, Martijn T. Bennebroek
Transaction-Based Communication-Centric Debug. [Citation Graph (0, 0)][DBLP] NOCS, 2007, pp:95-106 [Conf]
- Henk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen
Optimal Interconnect ATPG Under a Ground-Bounce Constraint. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:1, pp:17-31 [Journal]
A Run-Time Memory Protection Methodology. [Citation Graph (, )][DBLP]
You can catch more bugs with transaction level honey. [Citation Graph (, )][DBLP]
A high-level debug environment for communication-centric debug. [Citation Graph (, )][DBLP]
INDEXYS, a Logical Step beyond GENESYS. [Citation Graph (, )][DBLP]
A distributed architecture to check global properties for post-silicon debug. [Citation Graph (, )][DBLP]
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. [Citation Graph (, )][DBLP]
Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip. [Citation Graph (, )][DBLP]
Overview of Debug Standardization Activities. [Citation Graph (, )][DBLP]
Functional Debug Techniques for Embedded Systems. [Citation Graph (, )][DBLP]
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