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Publications of Author

1. Erik H. Volkerink, Subhasish Mitra
   Response compaction with any number of unknowns using a new LFSR architecture. [Citation Graph (0, 0)][DBLP]
   DAC, 2005, pp:117-122 [Conf]
   
2. Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra
   Speed Clustering of Integrated Circuits. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:1128-1137 [Conf]
   
3. Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
   Tackling test trade-offs from design, manufacturing to market using economic modeling. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:1098-1107 [Conf]
   
4. Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
   Packet-Based Input Test Data Compression Techniques. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:154-163 [Conf]
   
5. Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink
   ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1069-1078 [Conf]
   
6. Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
   Test Vector Compression Using EDA-ATE Synergies. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:97-102 [Conf]
   
7. Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Francois-Fabien Ferhani, Edward Li, Subhasish Mitra
   ELF-Murphy Data on Defects and Test Sets. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:16-22 [Conf]
   
8. Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
   Delay Defect Screening using Process Monitor Structures. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:43-52 [Conf]
   
9. Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges
   Test Economics for Multi-site Test with Modern Cost Reduction Techniques. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:411-416 [Conf]
   
10. Erik H. Volkerink, Subhasish Mitra
    Efficient Seed Utilization for Reseeding based Compression. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:232-240 [Conf]
    
11. 
    Empirical Validation of Yield Recovery Using Idle-Cycle Insertion. [Citation Graph (, )][DBLP]