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Shinichi Murai: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Takuji Ogihara, Shuichi Saruyama, Shinichi Murai
    PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. [Citation Graph (0, 0)][DBLP]
    DAC, 1985, pp:212-218 [Conf]
  2. Yasushi Koseko, Takuji Ogihara, Shinichi Murai
    Tri-state bus conflict checking method for ATPG using BDD. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1993, pp:512-515 [Conf]

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