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Publications of Author

1. Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
   Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. [Citation Graph (0, 0)][DBLP]
   DATE, 2005, pp:56-61 [Conf]
   
2. Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski
   Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1211-1220 [Conf]
   
3. Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press
   Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. [Citation Graph (0, 0)][DBLP]
   VTS, 2005, pp:223-228 [Conf]
   
4. Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz
   On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. [Citation Graph (0, 0)][DBLP]
   European Test Symposium, 2006, pp:239-246 [Conf]
   
5. Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
   Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality [Citation Graph (0, 0)][DBLP]
   CoRR, 2007, v:0, n:, pp:- [Journal]
   
6. 
   Production test challenges for highly integrated mobile phone SOCs - A case study. [Citation Graph (, )][DBLP]