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Fidel Muradali: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Robert C. Aitken, Fidel Muradali
    From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:2- [Conf]
  2. Robert C. Aitken, Fidel Muradali
    Trends in SLI design and their effect on test. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:628-637 [Conf]
  3. Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali
    Defect detection using power supply transient signal analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:67-76 [Conf]
  4. Fidel Muradali
    The Impact of Outsourcing on Test. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1216- [Conf]
  5. Fidel Muradali
    Future ATE: Perspectives & Requirements. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1297- [Conf]
  6. Fidel Muradali
    Diagnosis in Modern Design - Just the Tip of the Iceberg. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1302- [Conf]
  7. Chintan Patel, Fidel Muradali, James F. Plusquellic
    Power supply transient signal integration circuit. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:704-712 [Conf]
  8. Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
    Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:175-176 [Conf]
  9. Fidel Muradali, André Ivanov
    Do I Need this Tool for My Chips to Work? [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:471-472 [Conf]
  10. Fidel Muradali, Janusz Rajski
    A self-driven test structure for pseudorandom testing of non-scan sequential circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:17-25 [Conf]
  11. Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark
    Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:445-446 [Conf]
  12. Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li
    ITC 2003 panels: Part 2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:3, pp:175-176 [Journal]

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