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A. Candelori: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, A. Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. [Citation Graph (0, 0)][DBLP]
DATE, 2004, pp:584-589 [Conf] - Massimo Violante, M. Ceschia, Matteo Sonza Reorda, A. Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori
Analyzing SEU Effects in SRAM-based FPGAs. [Citation Graph (0, 0)][DBLP]
IOLTS, 2003, pp:119-123 [Conf] - Monica Alderighi, A. Candelori, Fabio Casini, Sergio D'Angelo, M. Mancini, A. Paccagnella, S. Pastore, Giacomo R. Sechi
Heavy Ion Effects on Configuration Logic of Virtex FPGAs. [Citation Graph (0, 0)][DBLP]
IOLTS, 2005, pp:49-53 [Conf] - F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Candelori
Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact, . [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:4, pp:549-555 [Journal] - F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Sanseverino, A. Candelori, G. Currò, A. Cascio, F. Frisina
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1847-1851 [Journal]
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