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A. Paccagnella: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. S. Cimino, A. Cester, A. Paccagnella, G. Ghidini
    Ionising radiation effects on MOSFET drain current. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1247-1251 [Journal]
  2. S. Gerardin, A. Griffoni, A. Cester, A. Paccagnella, G. Ghidini
    Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1669-1672 [Journal]
  3. Francesca Danesin, F. Zanon, S. Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, A. Paccagnella
    Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1750-1753 [Journal]

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