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M. Rosales:
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Publications of Author
- Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. [Citation Graph (0, 0)][DBLP] DATE, 2005, pp:464-465 [Conf]
- B. Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:947-953 [Conf]
- Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:1276-1284 [Conf]
- Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. [Citation Graph (0, 0)][DBLP] VTS, 2006, pp:358-363 [Conf]
- I. de Paúl, M. Rosales, B. Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. [Citation Graph (0, 0)][DBLP] VTS, 2001, pp:286-291 [Conf]
- Sebstatià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs [Citation Graph (0, 0)][DBLP] CoRR, 2007, v:0, n:, pp:- [Journal]
LAGOVirtual: A Collaborative Environment for the Large Aperture GRB Observatory [Citation Graph (, )][DBLP]
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