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Ernesto Sánchez: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
    An effective technique for minimizing the cost of processor software-based diagnosis in SoCs. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:412-417 [Conf]
  2. Lorena Anghel, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero, Raoul Velazco
    Coupling Different Methodologies to Validate Obsolete Microprocessors. [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:250-255 [Conf]
  3. Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero
    On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:494-504 [Conf]
  4. Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero
    Automatic Completion and Refinement of Verification Sets for Microprocessor Cores. [Citation Graph (0, 0)][DBLP]
    EvoWorkshops, 2005, pp:205-214 [Conf]
  5. Ernesto Sánchez, Giovanni Squillero, Massimo Violante
    Exploiting HW Acceleration for Classifying Complex Test Program Generation Problems. [Citation Graph (0, 0)][DBLP]
    EvoWorkshops, 2004, pp:230-239 [Conf]
  6. Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero, Luca Sterpone, Massimo Violante
    New evolutionary techniques for test-program generation for complex microprocessor cores. [Citation Graph (0, 0)][DBLP]
    GECCO, 2005, pp:2193-2194 [Conf]
  7. Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Sánchez, Matteo Sonza Reorda
    Integrating BIST Techniques for On-Line SoC Testing. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:235-240 [Conf]
  8. Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
    Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets. [Citation Graph (0, 0)][DBLP]
    MTV, 2005, pp:37-41 [Conf]
  9. W. Lindsay, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero
    Automatic Test Programs Generation Driven by Internal Performance Counters. [Citation Graph (0, 0)][DBLP]
    MTV, 2004, pp:8-13 [Conf]
  10. Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante
    Automatic generation of test sets for SBST of microprocessor IP cores. [Citation Graph (0, 0)][DBLP]
    SBCCI, 2005, pp:74-79 [Conf]
  11. Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero
    Evolving Warriors for the Nano Core. [Citation Graph (0, 0)][DBLP]
    CIG, 2006, pp:272-278 [Conf]
  12. Fulvio Corno, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero
    Automatic Test Program Generation: A Case Study. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:2, pp:102-109 [Journal]
  13. Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero
    Efficient Techniques for Automatic Verification-Oriented Test Set Optimization. [Citation Graph (0, 0)][DBLP]
    International Journal of Parallel Programming, 2006, v:34, n:1, pp:93-109 [Journal]
  14. Fulvio Corno, Ernesto Sánchez, Giovanni Squillero
    Evolving assembly programs: how games help microprocessor validation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Evolutionary Computation, 2005, v:9, n:6, pp:695-706 [Journal]
  15. Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
    Interactive presentation: An enhanced technique for the automatic generation of effective diagnosis-oriented test programs for processor. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:1158-1163 [Conf]
  16. Leticia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero
    Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral cores. [Citation Graph (0, 0)][DBLP]
    GECCO, 2007, pp:1912-1919 [Conf]
  17. Leticia Maria Veiras Bolzani, E. Sanchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
    An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2007, pp:265-270 [Conf]
  18. Paolo Bernardi, Michelangelo Grosso, E. Sanchez, Matteo Sonza Reorda
    On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:179-184 [Conf]

  19. An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction. [Citation Graph (, )][DBLP]


  20. Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. [Citation Graph (, )][DBLP]


  21. Evolving Individual Behavior in a Multi-agent Traffic Simulator. [Citation Graph (, )][DBLP]


  22. Exploiting Evolution for an Adaptive Drift-Robust Classifier in Chemical Sensing. [Citation Graph (, )][DBLP]


  23. Automatic detection of software defects: an industrial experience. [Citation Graph (, )][DBLP]


  24. Towards drift correction in chemical sensors using an evolutionary strategy. [Citation Graph (, )][DBLP]


  25. A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. [Citation Graph (, )][DBLP]


  26. A local analysis of an incremental evolutionary tool for processor diagnosis. [Citation Graph (, )][DBLP]


  27. Co-evolution of test programs and stimuli vectors for testing of embedded peripheral cores. [Citation Graph (, )][DBLP]


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