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Jeanne Bickford: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, R. Sommer, Michael Pronath, A. Ripp
    DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:387-392 [Conf]
  2. Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Muller, Sven Peyer, Christian Schulte
    Yield Improvement by Local Wiring Redundancy. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:473-478 [Conf]

  3. Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. [Citation Graph (, )][DBLP]


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