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Publications of Author

1. Kanad Chakraborty, Anurag Gupta, Mayukh Bhattacharya, Shriram Kulkarni, Pinaki Mazumder
   A Physical Design Tool for Built-in Self-Repairable Static RAMs. [Citation Graph (0, 0)][DBLP]
   DATE, 1999, pp:714-0 [Conf]
   
2. Mayukh Bhattacharya, Pinaki Mazumder
   Noise Margins of Threshold Logic Gates containing Resonant Tunneling Diodes. [Citation Graph (0, 0)][DBLP]
   Great Lakes Symposium on VLSI, 1998, pp:65-70 [Conf]
   
3. Alejandro F. González, Mayukh Bhattacharya, Shriram Kulkarni, Pinaki Mazumder
   Standard CMOS Implementation of a Multiple-Valued Logic Signed-Digit Adder Based on Negative Differential-Resistance Devices. [Citation Graph (0, 0)][DBLP]
   ISMVL, 2000, pp:323-0 [Conf]
   
4. Mayukh Bhattacharya, Pinaki Mazumder
   Convergence Issues in Resonant Tunneling Diode Circuit Simulation. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2000, pp:499-0 [Conf]
   
5. Mayukh Bhattacharya, Pinaki Mazumder, Ronald J. Lomax
   Fd-Tlm Electromagnetic Field Simulation Of High-Speed Iii-V Heterojunction Bipolar Transistor Digital Logic Gates. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2001, pp:470-474 [Conf]
   
6. Pinaki Mazumder, Shriram Kulkarni, Mayukh Bhattacharya, Alejandro F. González
   Circuit Design using Resonant Tunneling Diodes. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 1998, pp:501-506 [Conf]
   
7. Qinwei Xu, Pinaki Mazumder, Mayukh Bhattacharya
   Modeling of Nonuniform Interconnects by Using Differential Quadrature Method. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2001, pp:327-332 [Conf]
   
8. Mayukh Bhattacharya, Pinaki Mazumder
   Augmentation of SPICE for simulation of circuits containingresonant tunneling diodes. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:1, pp:39-50 [Journal]
   
9. Kanad Chakraborty, Shriram Kulkarni, Mayukh Bhattacharya, Pinaki Mazumder, Anurag Gupta
   A physical design tool for built-in self-repairable RAMs. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. VLSI Syst., 2001, v:9, n:2, pp:352-364 [Journal]