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Paul Theo Gonciari:
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- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression. [Citation Graph (0, 0)][DBLP] DATE, 2002, pp:604-611 [Conf]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Test Data Compression: The System Integrator's Perspective. [Citation Graph (0, 0)][DBLP] DATE, 2003, pp:10726-10731 [Conf]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:64-73 [Conf]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions. [Citation Graph (0, 0)][DBLP] VTS, 2002, pp:423-432 [Conf]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Variable-length input Huffman coding for system-on-a-chip test. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:6, pp:783-796 [Journal]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Addressing useless test data in core-based system-on-a-chip test. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:11, pp:1568-1580 [Journal]
- Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
Synchronization overhead in SOC compressed test. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:1, pp:140-152 [Journal]
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