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1. Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
   Evaluation of Error-Resilience for Reliable Compression of Test Data. [Citation Graph (0, 0)][DBLP]
   DATE, 2005, pp:1284-1289 [Conf]
   
2. Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park
   A Test-Vector Generation Methodology for Crosstalk Noise Faults. [Citation Graph (0, 0)][DBLP]
   DFT, 2002, pp:40-50 [Conf]
   
3. Hamidreza Hashempour, Fabrizio Lombardi
   ATE-Amenable Test Data Compression with No Cyclic Scan. [Citation Graph (0, 0)][DBLP]
   DFT, 2003, pp:151-158 [Conf]
   
4. Hamidreza Hashempour, Fabrizio Lombardi
   Compression of VLSI Test Data by Arithmetic Coding. [Citation Graph (0, 0)][DBLP]
   DFT, 2004, pp:150-157 [Conf]
   
5. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
   Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. [Citation Graph (0, 0)][DBLP]
   DFT, 2002, pp:186-194 [Conf]
   
6. Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
   Error-Resilient Test Data Compression Using Tunstall Codes. [Citation Graph (0, 0)][DBLP]
   DFT, 2004, pp:316-323 [Conf]
   
7. Hamidreza Hashempour, Fabrizio Lombardi
   A Novel Methodology for Functional Test Data Compression. [Citation Graph (0, 0)][DBLP]
   DFT, 2006, pp:128-135 [Conf]
   
8. Hamidreza Hashempour, Fabrizio Lombardi
   Evaluation of heuristic techniques for test vector ordering. [Citation Graph (0, 0)][DBLP]
   ACM Great Lakes Symposium on VLSI, 2004, pp:96-99 [Conf]
   
9. Hamidreza Hashempour, Fabrizio Lombardi
   Two dimensional reordering of functional test data for compression by ATE. [Citation Graph (0, 0)][DBLP]
   ACM Great Lakes Symposium on VLSI, 2005, pp:188-192 [Conf]
   
10. Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
    Enhancing error resilience for reliable compression of VLSI test data. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2005, pp:371-376 [Conf]
    
11. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
    Hybrid Multisite Testing at Manufacturing. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:927-936 [Conf]
    
12. Hamidreza Hashempour, Fabrizio Lombardi
    Application of Arithmetic Coding to Compression of VLSI Test Data. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2005, v:54, n:9, pp:1166-1177 [Journal]
    
13. Hamidreza Hashempour, Fabrizio Lombardi
    Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:841-846 [Conf]
    
14. 
    Device Model for Ballistic CNFETs Using the First Conducting Band. [Citation Graph (, )][DBLP]