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Tsu-Wei Tseng: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
    An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:574-579 [Conf]
  2. Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang
    A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:53-58 [Conf]
  3. Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen
    A Built-In Self-Repair Scheme for Multiport RAMs. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:355-360 [Conf]
  4. Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
    An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  5. Chao-Da Huang, Jin-Fu Li, Tsu-Wei Tseng
    ProTaR: An Infrastructure IP for Repairing RAMs in System-on-Chips. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:10, pp:1135-1143 [Journal]

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