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Thomas J. Vogels: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb
Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. [Citation Graph (0, 0)][DBLP]
DATE, 1998, pp:822-0 [Conf] - Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels
Fault Tuples in Diagnosis of Deep-Submicron Circuits. [Citation Graph (0, 0)][DBLP]
ITC, 2002, pp:233-241 [Conf] - Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey
Deformations of IC Structure in Test and Yield Learning. [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:856-865 [Conf] - Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton
Progressive Bridge Identification. [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:309-318 [Conf] - Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, V. Rovner, S. Tiwary
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. [Citation Graph (0, 0)][DBLP]
ITC, 2004, pp:508-517 [Conf] - Thomas J. Vogels
Effectiveness of I-V Testing in Comparison to IDDq Tests. [Citation Graph (0, 0)][DBLP]
VTS, 2003, pp:47-56 [Conf]
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