Chunsheng Liu, Vikram Iyengar Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking. [Citation Graph (0, 0)][DBLP] DATE, 2006, pp:652-657 [Conf]
Érika F. Cota, Chunsheng Liu Constraint-Driven Test Scheduling for NoC-Based Systems. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:11, pp:2465-2478 [Journal]
Chunsheng Liu, Krishnendu Chakrabarty Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:5, pp:593-604 [Journal]
Chunsheng Liu, Krishnendu Chakrabarty Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:10, pp:1447-1459 [Journal]
Dhiraj K. Pradhan, Chunsheng Liu EBIST: a novel test generator with built-in fault detection capability. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:9, pp:1457-1466 [Journal]
Chunsheng Liu Improve the Quality of Per-Test Fault Diagnosis Using Output Information. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2007, v:23, n:1, pp:11-24 [Journal]
The Experimental Study on Ocular Rigidity of Rabbit In Vivo. [Citation Graph (, )][DBLP]
Effects of Aging on Biomechanics Properties in Rabbit Eyes. [Citation Graph (, )][DBLP]
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