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Guido Gronthoud: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
    Memory Testing Under Different Stress Conditions: An Industrial Evaluation. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:438-443 [Conf]
  2. José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
    VDD Ramp Testing for RF Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:651-658 [Conf]
  3. José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller
    Power Supply Ramping for Quasi-static Testing of PLLs. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:980-987 [Conf]
  4. Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
    On Hazard-free Patterns for Fine-delay Fault Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:213-222 [Conf]
  5. Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
    Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:95-104 [Conf]
  6. Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
    A New Algorithm for Dynamic Faults Detection in RAMs. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:177-182 [Conf]
  7. Xinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud
    A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:266-271 [Conf]
  8. Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
    Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:345-350 [Conf]
  9. Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
    On Performance Testing with Path Delay Patterns. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:29-34 [Conf]
  10. Jens Anders, Shaji Krishnan, Guido Gronthoud
    Re-configuration of sub-blocks for effective application of time domain tests. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:707-712 [Conf]
  11. Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
    Memory Testing Under Different Stress Conditions: An Industrial Evaluation [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  12. José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
    Multi-VDD Testing for Analog Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:311-322 [Journal]
  13. Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud
    Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:399-409 [Journal]

  14. Algorithms for ADC Multi-site Test with Digital Input Stimulus. [Citation Graph (, )][DBLP]


  15. Modeling Power Supply Noise in Delay Testing. [Citation Graph (, )][DBLP]


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