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Robert Madge: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller
    Creating Value Through Test. [Citation Graph (0, 0)][DBLP]
    DATE, 2003, pp:10402-10409 [Conf]
  2. Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
    Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1285-1294 [Conf]
  3. Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
    Impact of Multiple-Detect Test Patterns on Product Quality. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1031-1040 [Conf]
  4. W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
    Neighbor selection for variance reduction in I_DDQ and other parametric data. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:92-100 [Conf]
  5. W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
    Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1240- [Conf]
  6. Robert Madge
    ATE Value Add through Open Data Collection. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1430- [Conf]
  7. Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
    In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:203-212 [Conf]
  8. Robert Madge
    New Test Paradigms for Yield and Manufacturability. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:13- [Conf]
  9. Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner
    Screening MinVDD Outliers Using Feed-Forward Voltage Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:673-682 [Conf]
  10. Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
    ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:181-189 [Conf]
  11. Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
    Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:565-573 [Conf]
  12. David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
    Isolating and Removing Sources of Variation in Test Data. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:464-471 [Conf]
  13. Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch
    Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:39-46 [Conf]
  14. Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware
    Detection of Temperature Sensitive Defects Using ZTC. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:185-192 [Conf]
  15. Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch
    Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:69-74 [Conf]
  16. Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
    Defect Screening Using Independent Component Analysis on I_DDQ. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:427-432 [Conf]
  17. W. Robert Daasch, James McNames, Robert Madge, Kevin Cota
    Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:74-81 [Journal]
  18. Robert Madge
    New test paradigms for yield and manufacturability. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:240-246 [Journal]
  19. Robert Madge, Brady Benware, W. Robert Daasch
    Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:46-53 [Journal]
  20. Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
    Making Manufacturing Work For You. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:107-108 [Conf]

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