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Kouhei Ohtani: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara
    A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. [Citation Graph (0, 0)][DBLP]
    DATE, 2003, pp:10310-10315 [Conf]

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