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Rosa Rodríguez-Montañés: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Rosa Rodríguez-Montañés, Joan Figueras
    Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. [Citation Graph (0, 0)][DBLP]
    DATE, 1998, pp:490-494 [Conf]
  2. L. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
    Lissajous Based Mixed-Signal Testing for N-Observable Signals. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:125-130 [Conf]
  3. Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco
    A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. [Citation Graph (0, 0)][DBLP]
    DSN, 2003, pp:563-572 [Conf]
  4. Rosa Rodríguez-Montañés, Joan Figueras
    Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. [Citation Graph (0, 0)][DBLP]
    EDAC-ETC-EUROASIC, 1994, pp:356-360 [Conf]
  5. Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras
    Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:99-103 [Conf]
  6. Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls
    Bridging Defects Resistance Measurements in a CMOS Process. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:892-899 [Conf]
  7. Rosa Rodríguez-Montañés, J. A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio
    Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:510-519 [Conf]
  8. Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras
    RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:814-823 [Conf]
  9. José Pineda de Gyvez, Rosa Rodríguez-Montañés
    Threshold Voltage Mismatch (DeltaVT) Fault Modeling. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:145-150 [Conf]
  10. Salvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    BIST Technique by Equally Spaced Test Vector Sequences. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:206-216 [Conf]
  11. Rosa Rodríguez-Montañés, Joan Figueras
    Bridges in sequential CMOS circuits: current-voltage signatur. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:68-73 [Conf]
  12. D. Arumi, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:145-150 [Conf]
  13. Rosa Rodríguez-Montañés, D. Arumi, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Full Open Defects in Interconnecting Lines. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:158-166 [Conf]
  14. Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez
    Resistance Characterization for Weak Open Defects. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:18-26 [Journal]
  15. Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    IDDQ testing: state of the art and future trends. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:167-196 [Journal]

  16. Full Open Defects in Nanometric CMOS. [Citation Graph (, )][DBLP]


  17. Diagnosis of full open defects in interconnect lines with fan-out. [Citation Graph (, )][DBLP]


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