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Publications of Author

1. Rosa Rodríguez-Montañés, Joan Figueras
   Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. [Citation Graph (0, 0)][DBLP]
   DATE, 1998, pp:490-494 [Conf]
   
2. L. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
   Lissajous Based Mixed-Signal Testing for N-Observable Signals. [Citation Graph (0, 0)][DBLP]
   DDECS, 2006, pp:125-130 [Conf]
   
3. Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco
   A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. [Citation Graph (0, 0)][DBLP]
   DSN, 2003, pp:563-572 [Conf]
   
4. Rosa Rodríguez-Montañés, Joan Figueras
   Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. [Citation Graph (0, 0)][DBLP]
   EDAC-ETC-EUROASIC, 1994, pp:356-360 [Conf]
   
5. Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras
   Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2002, pp:99-103 [Conf]
   
6. Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls
   Bridging Defects Resistance Measurements in a CMOS Process. [Citation Graph (0, 0)][DBLP]
   ITC, 1992, pp:892-899 [Conf]
   
7. Rosa Rodríguez-Montañés, J. A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio
   Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. [Citation Graph (0, 0)][DBLP]
   ITC, 1991, pp:510-519 [Conf]
   
8. Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras
   RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:814-823 [Conf]
   
9. José Pineda de Gyvez, Rosa Rodríguez-Montañés
   Threshold Voltage Mismatch (DeltaVT) Fault Modeling. [Citation Graph (0, 0)][DBLP]
   VTS, 2003, pp:145-150 [Conf]
   
10. Salvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    BIST Technique by Equally Spaced Test Vector Sequences. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:206-216 [Conf]
    
11. Rosa Rodríguez-Montañés, Joan Figueras
    Bridges in sequential CMOS circuits: current-voltage signatur. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:68-73 [Conf]
    
12. D. Arumi, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:145-150 [Conf]
    
13. Rosa Rodríguez-Montañés, D. Arumi, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Full Open Defects in Interconnecting Lines. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:158-166 [Conf]
    
14. Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez
    Resistance Characterization for Weak Open Defects. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:18-26 [Journal]
    
15. Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    IDDQ testing: state of the art and future trends. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:167-196 [Journal]
    
16. 
    Full Open Defects in Nanometric CMOS. [Citation Graph (, )][DBLP]
    
    
17. 
    Diagnosis of full open defects in interconnect lines with fan-out. [Citation Graph (, )][DBLP]