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Ben Bennetts: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
    Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:1184-1191 [Conf]
  2. Ben Bennetts
    Progress in DFT: A Personal View. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:19-20 [Conf]
  3. Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
    Macro Testability: The Results of Production Device Applications. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:232-241 [Conf]
  4. Ben Bennetts, D. W. Lewin
    Fault Diagnosis of Digital Systems - A Review. [Citation Graph (0, 0)][DBLP]
    Comput. J., 1971, v:14, n:2, pp:199-206 [Journal]
  5. Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
    Built-In Self-Test: Assuring System Integrity. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1996, v:29, n:11, pp:39-45 [Journal]
  6. Ben Bennetts
    Guest Editor's Introduction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:6-7 [Journal]
  7. Ben Bennetts
    Test Technology in Europe. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1990, v:7, n:1, pp:6-8 [Journal]
  8. Tony Ambler, Ben Bennetts
    Guest Editors' Introduction: Test and the Product Life Cycle. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:3, pp:20-22 [Journal]
  9. Monica Lobetti Bodoni, Ben Bennetts
    Guest Editors' Introduction: Board Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:2, pp:5-7 [Journal]
  10. Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts
    Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:2, pp:8-18 [Journal]
  11. Mike Wondolowski, Ben Bennetts, Adam W. Ley
    Boundary Scan: The Internet of Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:3, pp:34-43 [Journal]
  12. Bill Eklow, Ben Bennetts
    New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:253-254 [Conf]
  13. Ben Bennetts
    Electronics Design-for-Test: Past, Present and Future. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:4- [Conf]

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