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Publications of Author

1. Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
   Defect Aware Test Patterns. [Citation Graph (0, 0)][DBLP]
   DATE, 2005, pp:450-455 [Conf]
   
2. Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita
   On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:83-89 [Conf]
   
3. Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
   On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1079-1088 [Conf]
   
4. Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz
   On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2005, pp:59-64 [Conf]
   
5. Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
   On Methods to Improve Location Based Logic Diagnosis. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2006, pp:181-187 [Conf]
   
6. Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
   Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:225-230 [Conf]
   
7. Huaxing Tang, Sharma Manish, Janusz Rajski, Martin Keim, Brady Benware
   Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. [Citation Graph (0, 0)][DBLP]
   European Test Symposium, 2007, pp:145-150 [Conf]