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Yi-Shing Chang:
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Publications of Author
- Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang
A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit. [Citation Graph (0, 0)][DBLP] DATE, 2004, pp:1078-1083 [Conf]
- Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti
On Modeling Cross-Talk Faults. [Citation Graph (0, 0)][DBLP] DATE, 2003, pp:10490-10495 [Conf]
- Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty
An Approach to Minimizing Functional Constraints. [Citation Graph (0, 0)][DBLP] DFT, 2006, pp:215-226 [Conf]
- Thou-Ho Chen, Liang-Gee Chen, Yi-Shing Chang
Design of Concurrent Error-Detectable VLSI-Based Array Dividers. [Citation Graph (0, 0)][DBLP] ICCD, 1992, pp:72-75 [Conf]
- Yi-Shing Chang, Sreejit Chakravarty, Hiep Hoang, Nick Thorpe, Khen Wee
Transition Tests for High Performance Microprocessors. [Citation Graph (0, 0)][DBLP] VTS, 2005, pp:29-34 [Conf]
- Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. [Citation Graph (0, 0)][DBLP] VTS, 2001, pp:358-367 [Conf]
- Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
Test Generation for Maximizing Ground Bounce Considering Circuit Delay. [Citation Graph (0, 0)][DBLP] VTS, 2003, pp:151-157 [Conf]
- Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
Analysis of Ground Bounce in Deep Sub-Micron Circuits. [Citation Graph (0, 0)][DBLP] VTS, 1997, pp:110-116 [Conf]
- Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
Test Generation for Ground Bounce in Internal Logic Circuitry. [Citation Graph (0, 0)][DBLP] VTS, 1999, pp:95-105 [Conf]
- Sreejit Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, Cheryl Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee
Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor. [Citation Graph (0, 0)][DBLP] VTS, 2005, pp:337-342 [Conf]
- Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti
On modeling crosstalk faults. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:12, pp:1909-1915 [Journal]
Efficient Selection of Observation Points for Functional Tests. [Citation Graph (, )][DBLP]
An Industrial Case Study of Sticky Path-Delay Faults. [Citation Graph (, )][DBLP]
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