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Kees Veelenturf: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kees Veelenturf
    The Road to Better Reliability and Yield Embedded DfM Tools. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:67- [Conf]
  2. Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf
    Tutorial Statement. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:66- [Conf]
  3. Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen
    Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:872-0 [Conf]

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