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Anthony P. Ambler: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman
    From DFT to systems test - a model based cost optimization tool. [Citation Graph (0, 0)][DBLP]
    DATE, 2001, pp:302-306 [Conf]
  2. Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
    Economics in Design and Test. [Citation Graph (0, 0)][DBLP]
    ICCD, 1993, pp:384-387 [Conf]
  3. Taikyeong T. Jeong, Anthony P. Ambler
    Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. [Citation Graph (0, 0)][DBLP]
    ICCSA (5), 2006, pp:531-536 [Conf]
  4. Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler
    Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:194-199 [Conf]
  5. Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler
    Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:255-256 [Conf]
  6. Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler
    A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:415-421 [Conf]
  7. Anthony P. Ambler
    Is It Rocket Science? [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1188-1189 [Conf]
  8. Chryssa Dislis, J. H. Dick, Anthony P. Ambler
    Algorithms for Cost Optimised Test Strategy Selection. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:383-391 [Conf]
  9. Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
    Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:210-217 [Conf]
  10. Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
    Cost Analysis of Test Method Environments. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:875-883 [Conf]
  11. Des Farren, Anthony P. Ambler
    System Test Cost Modelling Based on Event Rate Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:84-92 [Conf]
  12. Des Farren, Anthony P. Ambler
    Cost-Effective System-Level Test Strategies. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:807-813 [Conf]
  13. Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear
    Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:232-243 [Conf]
  14. Prab Varma, Anthony P. Ambler, Keith Baker
    An Analysis of the Economics of Self Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:20-30 [Conf]
  15. David Williams, Anthony P. Ambler
    System Manufacturing Test Cost Model. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:482-490 [Conf]
  16. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
    Economic Effects in Design and Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1991, v:8, n:4, pp:64-77 [Journal]
  17. Des Farren, Anthony P. Ambler
    The Economics of System-Level Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:51-58 [Journal]

  18. A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. [Citation Graph (, )][DBLP]

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