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Zhanglei Wang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel
    Test set enrichment using a probabilistic fault model and the theory of output deviations. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:1270-1275 [Conf]
  2. Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
    SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:201-206 [Conf]
  3. Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek
    A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:125-130 [Conf]
  4. Lei Li, Zhanglei Wang, Krishnendu Chakrabarty
    Scan-BIST based on cluster analysis and the encoding of repeating sequences. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2007, v:12, n:1, pp:- [Journal]
  5. Zhanglei Wang, Krishnendu Chakrabarty
    Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:145-161 [Journal]

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