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Publications of Author

1. Carsten Wegener, Michael Peter Kennedy
   Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. [Citation Graph (0, 0)][DBLP]
   DATE, 2000, pp:765- [Conf]
   
2. Carsten Wegener, Michael Peter Kennedy
   Linear Model-Based Error Identification and Calibration for Data Converters. [Citation Graph (0, 0)][DBLP]
   DATE, 2003, pp:10630-10635 [Conf]
   
3. Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy
   Method of reducing contactor effect when testing high-precision ADCs. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:210-217 [Conf]
   
4. Carsten Wegener, Michael Peter Kennedy
   Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:851-860 [Conf]
   
5. Carsten Wegener, Michael Peter Kennedy
   Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:3, pp:299-310 [Journal]
   
6. Carsten Wegener, Michael Peter Kennedy
   Test Development Through Defect and Test Escape Level Estimation for Data Converters. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:4-6, pp:313-324 [Journal]
   
7. 
   An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. [Citation Graph (, )][DBLP]