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Michael Peter Kennedy: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Carsten Wegener, Michael Peter Kennedy
    Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:765- [Conf]
  2. Carsten Wegener, Michael Peter Kennedy
    Linear Model-Based Error Identification and Calibration for Data Converters. [Citation Graph (0, 0)][DBLP]
    DATE, 2003, pp:10630-10635 [Conf]
  3. Géza Kolumbán, Michael Peter Kennedy
    Recent results for chaotic modulation schemes. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2001, pp:141-144 [Conf]
  4. P. Acco, Michael Peter Kennedy, C. Mira, B. Morley, B. Frigyik
    Behavioral modeling of charge pump phase locked loops. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 1999, pp:375-378 [Conf]
  5. Michael Peter Kennedy, Géza Kolumbán, Gábor Kis
    Simulation of the multipath performance of FM-DCSK digital communications using chaos. [Citation Graph (0, 0)][DBLP]
    ISCAS (4), 1999, pp:568-571 [Conf]
  6. Géza Kolumbán, Z. Jako, Michael Peter Kennedy
    Enhanced versions of DCSK and FM-DCSK data transmission systems. [Citation Graph (0, 0)][DBLP]
    ISCAS (4), 1999, pp:475-478 [Conf]
  7. Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy
    Method of reducing contactor effect when testing high-precision ADCs. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:210-217 [Conf]
  8. Carsten Wegener, Michael Peter Kennedy
    Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:851-860 [Conf]
  9. Michael Peter Kennedy, Géza Kolumbán
    Digital communications using chaos. [Citation Graph (0, 0)][DBLP]
    Signal Processing, 2000, v:80, n:7, pp:1307-1320 [Journal]
  10. D. Murphy, M. P. Kennedy, J. Buckley, Min Qu
    The optimum power conversion efficiency and associated gain of an LC CMOS oscillator. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  11. Zhipeng Ye, Tao Xu, M. P. Kennedy
    Locking range analysis for injection-locked frequency dividers. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  12. Carsten Wegener, Michael Peter Kennedy
    Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:299-310 [Journal]
  13. Carsten Wegener, Michael Peter Kennedy
    Test Development Through Defect and Test Escape Level Estimation for Data Converters. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:313-324 [Journal]

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