Yun-Che Wen A BIST Scheme for Testing Analog-to-Digital Converters with Digital Response Analyses. [Citation Graph (0, 0)][DBLP] VTS, 2005, pp:383-388 [Conf]
Yun-Che Wen, Kuen-Jong Lee Analysis and generation of control and observation structures foranalog circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:1, pp:165-171 [Journal]
Test scheme for switched-capacitor circuits by digital analyses. [Citation Graph (, )][DBLP]
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