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Jiri Jenícek: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jiri Jenícek, Ondrej Novák
    Test Pattern Compression Based on Pattern Overlapping. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:29-34 [Conf]
  2. Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský
    Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:300-308 [Conf]

  3. Efficient Test Pattern Compression Method Using Hard Fault Preferring. [Citation Graph (, )][DBLP]


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