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L. Balado:
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Publications of Author
- L. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
Lissajous Based Mixed-Signal Testing for N-Observable Signals. [Citation Graph (0, 0)][DBLP] DDECS, 2006, pp:125-130 [Conf]
- Marie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. [Citation Graph (0, 0)][DBLP] DELTA, 2004, pp:135-139 [Conf]
- Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. [Citation Graph (0, 0)][DBLP] IOLTW, 2002, pp:99-103 [Conf]
- Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden
Test Engineering Education in Europe: the EuNICE-Test Project. [Citation Graph (0, 0)][DBLP] MSE, 2003, pp:85-86 [Conf]
- Salvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
BIST Technique by Equally Spaced Test Vector Sequences. [Citation Graph (0, 0)][DBLP] VTS, 2004, pp:206-216 [Conf]
- R. Sanahuja, V. Barcons, L. Balado, Joan Figueras
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:3, pp:257-265 [Journal]
Analog circuit test based on a digital signature. [Citation Graph (, )][DBLP]
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