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L. Balado: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. L. Balado, E. Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
    Lissajous Based Mixed-Signal Testing for N-Observable Signals. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:125-130 [Conf]
  2. Marie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich
    Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:135-139 [Conf]
  3. Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras
    Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:99-103 [Conf]
  4. Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden
    Test Engineering Education in Europe: the EuNICE-Test Project. [Citation Graph (0, 0)][DBLP]
    MSE, 2003, pp:85-86 [Conf]
  5. Salvador Manich, L. García, L. Balado, E. Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    BIST Technique by Equally Spaced Test Vector Sequences. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:206-216 [Conf]
  6. R. Sanahuja, V. Barcons, L. Balado, Joan Figueras
    Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:257-265 [Journal]

  7. Analog circuit test based on a digital signature. [Citation Graph (, )][DBLP]

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