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Zhicheng Liang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Zhicheng Liang, Makoto Ikeda, Kunihiro Asada
    Analysis of Noise Margins Due to Device Parameter Variations in Sub-100nm CMOS Technology. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:81-86 [Conf]

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