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Michal Rakowski: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski
    Layout to Logic Defect Analysis for Hierarchical Test Generation. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:35-40 [Conf]

  2. Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. [Citation Graph (, )][DBLP]


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