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Philipp Öhler: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich
    Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:185-190 [Conf]
  2. Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich
    An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:91-96 [Conf]

  3. A Modular Memory BIST for Optimized Memory Repair. [Citation Graph (, )][DBLP]


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