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Mariane Comte:
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Publications of Author
- Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell
Electrical Behavior of GOS Fault affected Domino Logic Cell. [Citation Graph (0, 0)][DBLP] DELTA, 2006, pp:183-189 [Conf]
- Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
A New Methodology For ADC Test Flow Optimization. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:201-209 [Conf]
- Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2006, v:23, n:3, pp:234-243 [Journal]
- Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2007, pp:211-216 [Conf]
- Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2006, pp:159-164 [Conf]
- Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
A-to-D converters static error detection from dynamic parameter measurement. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2003, v:34, n:10, pp:945-953 [Journal]
- Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:3, pp:291-298 [Journal]
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