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Taisuke Iwakiri: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada
    Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:387-391 [Conf]
  2. Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada
    Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:287-0 [Conf]

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