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Arun Gunda: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. N. Devtaprasanna, Sudhakar M. Reddy, A. Gunda, P. Krishnamurthy, Irith Pomeranz
    Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:202-207 [Conf]
  2. Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
    Should Illinois-Scan Based Architectures be Centralized or Distributed? [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:406-414 [Conf]
  3. N. Devtaprasanna, A. Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
    Test Generation for Open Defects in CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:41-49 [Conf]
  4. N. Devtaprasanna, A. Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
    A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. [Citation Graph (0, 0)][DBLP]
    ICCD, 2005, pp:471-474 [Conf]
  5. Kaushik De, Arun Gunda
    Failure Analysis for Full-Scan Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:636-645 [Conf]
  6. N. Devtaprasanna, A. Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
    A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:185-192 [Conf]

  7. Systematic Scan Reconfiguration. [Citation Graph (, )][DBLP]


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