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Gerard A. Allan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Gerard A. Allan
    A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:44-0 [Conf]
  2. Gerard A. Allan, Anthony J. Walton
    Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. [Citation Graph (0, 0)][DBLP]
    DFT, 1994, pp:88-96 [Conf]
  3. Gerard A. Allan, Anthony J. Walton
    Efficient critical area estimation for arbitrary defect shapes. [Citation Graph (0, 0)][DBLP]
    DFT, 1997, pp:20-28 [Conf]
  4. Mike Moran, Gerard A. Allan
    IC Critical Volume Calculation through Ray-Casting of CSG Trees. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:12-29 [Conf]
  5. Gerard A. Allan
    Yield prediction by sampling IC layout. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:3, pp:359-371 [Journal]
  6. Gerard A. Allan, Anthony J. Walton
    Efficient extra material critical area algorithms. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:10, pp:1480-1486 [Journal]
  7. Gerard A. Allan, Anthony J. Walton, Robert J. Holwill
    A yield improvement technique for IC layout using local design rules. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:11, pp:1355-1362 [Journal]

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