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Glenn H. Chapman: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Glenn H. Chapman
    Laser Processes for Defect Correction in Large Area VLSI Systems. [Citation Graph (0, 0)][DBLP]
    DFT, 1994, pp:106-114 [Conf]
  2. Glenn H. Chapman
    FPGA Design for Decimeter Scale Integration (DMSI). [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:64-72 [Conf]
  3. Glenn H. Chapman, Yves Audet
    Creating 35 mm Camera Active Pixel Sensors. [Citation Graph (0, 0)][DBLP]
    DFT, 1999, pp:22-30 [Conf]
  4. Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
    Defect Avoidance in a 3-D Heterogeneous Sensor. [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:67-75 [Conf]
  5. Yves Audet, Glenn H. Chapman
    Design of a Self-Correcting Active Pixel Sensor. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:18-0 [Conf]
  6. Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
    Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:158-168 [Conf]
  7. Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
    On-Line Identification of Faults in Fault-Tolerant Imagers. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:149-157 [Conf]
  8. Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet
    Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:53-0 [Conf]
  9. Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet
    Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:58-66 [Conf]
  10. Vijay K. Jain, Glenn H. Chapman
    Level-Hybrid Optoelectronic TESH Interconnection Network. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:45-52 [Conf]
  11. Israel Koren, Zahava Koren, Glenn H. Chapman
    A Self-Correcting Active Pixel Camera. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:56-0 [Conf]
  12. Israel Koren, Zahava Koren, Glenn H. Chapman
    Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:3-10 [Conf]
  13. Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
    On-Line Mapping of In-Field Defects in Image Sensor Arrays. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:439-447 [Conf]
  14. Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas
    Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:448-456 [Conf]
  15. Vijay K. Jain, Glenn H. Chapman
    Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:157-165 [Conf]
  16. Glenn H. Chapman, Benoit Dufort
    Laser defect correction applications to FPGA based custom computers. [Citation Graph (0, 0)][DBLP]
    FCCM, 1997, pp:240-241 [Conf]
  17. Glenn H. Chapman, Benoit Dufort
    Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's. [Citation Graph (0, 0)][DBLP]
    FPGA, 1997, pp:17-23 [Conf]
  18. Glenn H. Chapman, M. Parameswaran, Marek Syrzycki
    Wafer-Scale Transducer Arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1992, v:25, n:4, pp:50-56 [Journal]
  19. Glenn H. Chapman, Benoit Dufort
    Using Laser Defect Avoidance to Build Large-Area FPGAs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:4, pp:75-81 [Journal]
  20. Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
    A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:544-551 [Journal]
  21. F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel
    A Monolithic Hough Transform Processor Based on Restructurable VLSI. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:106-110 [Journal]
  22. Yves Audet, Glenn H. Chapman
    Yield improvement of a large area magnetic field sensor array using redundancy schemes. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1997, v:5, n:1, pp:28-33 [Journal]
  23. S. K. Tewksbury, Glenn H. Chapman
    Guest Editorial Foreword to the Special Section on WSI'95. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1997, v:5, n:1, pp:1-2 [Journal]
  24. Régis Leveugle, Glenn H. Chapman
    Special section on defect and fault tolerance in VLSI systems. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:1, pp:1- [Journal]

  25. A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects. [Citation Graph (, )][DBLP]


  26. Quantitative Analysis of In-Field Defects in Image Sensor Arrays. [Citation Graph (, )][DBLP]


  27. Automatic Detection of In-field eld Defect Growth in Image Sensors. [Citation Graph (, )][DBLP]


  28. Defect Tolerance for a Capacitance Based Nanoscale Biosensor. [Citation Graph (, )][DBLP]


  29. Characterization of Gain Enhanced In-Field Defects in Digital Imagers. [Citation Graph (, )][DBLP]


  30. Statistical identification and analysis of defect development in digital imagers. [Citation Graph (, )][DBLP]


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