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Zahava Koren: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
    On-Line Identification of Faults in Fault-Tolerant Imagers. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:149-157 [Conf]
  2. Zahava Koren, Israel Koren
    Does the Floorplan of a Chip Affect Its Yield? [Citation Graph (0, 0)][DBLP]
    DFT, 1993, pp:159-166 [Conf]
  3. Israel Koren, Zahava Koren
    Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. [Citation Graph (0, 0)][DBLP]
    DFT, 1997, pp:166-174 [Conf]
  4. Israel Koren, Zahava Koren
    Yield and Routing Objectives in Floorplanning. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:28-36 [Conf]
  5. Israel Koren, Zahava Koren, Glenn H. Chapman
    A Self-Correcting Active Pixel Camera. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:56-0 [Conf]
  6. Israel Koren, Zahava Koren, Glenn H. Chapman
    Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:3-10 [Conf]
  7. Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
    On-Line Mapping of In-Field Defects in Image Sensor Arrays. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:439-447 [Conf]
  8. Vijay Lakamraju, Zahava Koren, C. Mani Krishna
    Synthesis of Interconnection Networks: A Novel Approach. [Citation Graph (0, 0)][DBLP]
    DSN, 2000, pp:501-0 [Conf]
  9. Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna
    Pre-Processing Input Data to Augment Fault Tolerance in Space Applications. [Citation Graph (0, 0)][DBLP]
    DSN, 2003, pp:491-500 [Conf]
  10. Israel Koren, Zahava Koren
    On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components. [Citation Graph (0, 0)][DBLP]
    ICDCS, 1988, pp:26-32 [Conf]
  11. Aura Ganz, Zahava Koren
    WDM Passive Star-Protocols and Performance Analysis. [Citation Graph (0, 0)][DBLP]
    INFOCOM, 1991, pp:991-1000 [Conf]
  12. Zahava Koren, Israel Koren, C. Mani Krishna
    Surge Handling as a Measure of Real-Time System Dependability. [Citation Graph (0, 0)][DBLP]
    IPPS/SPDP Workshops, 1998, pp:1106-1116 [Conf]
  13. Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman
    Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems. [Citation Graph (0, 0)][DBLP]
    IPDPS, 2002, pp:- [Conf]
  14. Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna
    Measuring the Vulnerability of Interconnection Networks in Embedded Systems. [Citation Graph (0, 0)][DBLP]
    IPPS/SPDP Workshops, 1998, pp:919-924 [Conf]
  15. E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz
    Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer. [Citation Graph (0, 0)][DBLP]
    PRDC, 2004, pp:43-48 [Conf]
  16. Zahava Koren, Imrich Chlamtac, Aura Ganz
    A model for evaluating demand assignment protocols with arbitrary workloads. [Citation Graph (0, 0)][DBLP]
    SIGCOMM, 1986, pp:40-44 [Conf]
  17. Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
    A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:544-551 [Journal]
  18. Israel Koren, Zahava Koren
    Incorporating Yield Enhancement into the Floorplanning Process. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2000, v:49, n:6, pp:532-541 [Journal]
  19. Israel Koren, Zahava Koren
    Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1991, v:40, n:9, pp:1024-1033 [Journal]
  20. Israel Koren, Zahava Koren, Stephen Y. H. Su
    Analaysis of a Class of Recovery Procedures. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1986, v:35, n:8, pp:703-712 [Journal]
  21. Israel Koren, Zahava Koren, Charles H. Stapper
    A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1993, v:42, n:6, pp:724-734 [Journal]
  22. Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn
    The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1994, v:43, n:12, pp:1398-1406 [Journal]
  23. Israel Koren, Zahava Koren, Charles H. Stapper
    A statistical study of defect maps of large area VLSI IC's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1994, v:2, n:2, pp:249-256 [Journal]
  24. Zahava Koren, Israel Koren
    On the effect of floorplanning on the yield of large area integrated circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1997, v:5, n:1, pp:3-14 [Journal]

  25. Quantitative Analysis of In-Field Defects in Image Sensor Arrays. [Citation Graph (, )][DBLP]


  26. Automatic Detection of In-field eld Defect Growth in Image Sensors. [Citation Graph (, )][DBLP]


  27. Characterization of Gain Enhanced In-Field Defects in Digital Imagers. [Citation Graph (, )][DBLP]


  28. Statistical identification and analysis of defect development in digital imagers. [Citation Graph (, )][DBLP]


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