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Frederic Duvivier :
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Sandrine Barberan , Frederic Duvivier Management of Critical Areas and Defectivity Data for Yield Trend Modeling. [Citation Graph (0, 0)][DBLP ] DFT, 1998, pp:17-0 [Conf ] Frederic Duvivier Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. [Citation Graph (0, 0)][DBLP ] DFT, 1999, pp:61-0 [Conf ] Frederic Duvivier , M. Rivier , B. Burtschy , J. J. Charlot Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM. [Citation Graph (0, 0)][DBLP ] DFT, 1993, pp:152-158 [Conf ] Sandra Levasseur , Frederic Duvivier Application of a yield model merging critical areas and defectivity to industrial products. [Citation Graph (0, 0)][DBLP ] DFT, 1997, pp:11-19 [Conf ] Search in 0.001secs, Finished in 0.001secs