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Anand Gopalan:
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- Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
Dynamic Input Match Correction in RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP] DFT, 2004, pp:211-219 [Conf]
- Anand Gopalan, Tejasvi Das, Clyde Washburn, Ponnathpur R. Mukund
Use of source degeneration for non-intrusive BIST of RF front-end circuits. [Citation Graph (0, 0)][DBLP] ISCAS (5), 2005, pp:4385-4388 [Conf]
- Anand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund
An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP] VLSI Design, 2005, pp:485-490 [Conf]
- Antonija Soldo, Anand Gopalan, P. R. Mukund, Martin Margala
A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems. [Citation Graph (0, 0)][DBLP] VLSI Design, 2004, pp:1023-1026 [Conf]
- Anand Gopalan, Martin Margala, P. R. Mukund
A current based self-test methodology for RF front-end circuits. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2005, v:36, n:12, pp:1091-1102 [Journal]
- Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
Towards Fault-Tolerant RF Front Ends. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2006, v:22, n:4-6, pp:371-386 [Journal]
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