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Clyde Washburn: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
    Dynamic Input Match Correction in RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:211-219 [Conf]
  2. Sripriya R. Bandi, Clyde Washburn, P. R. Mukund, Jan Kolnik, Minxuan Liu, Ken Paradis, Steve Howard, Jeff Burleson
    Accurate performance prediction of multi-GHz CML with data run-length variations. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2005, pp:5103-5106 [Conf]
  3. Anand Gopalan, Tejasvi Das, Clyde Washburn, Ponnathpur R. Mukund
    Use of source degeneration for non-intrusive BIST of RF front-end circuits. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2005, pp:4385-4388 [Conf]
  4. Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson
    Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:295-300 [Conf]
  5. Anand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund
    An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:485-490 [Conf]
  6. Ghanshyam Nayak, Clyde Washburn, P. R. Mukund
    System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:878-881 [Conf]
  7. Mark Pude, Clyde Washburn, Ponnathpur R. Mukund, Kouichi Abe, Yoshinori Nishi
    An analytical propagation delay model with power supply noise effects. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  8. S. Sridharan, Sripriya R. Bandi, Clyde Washburn, Ponnathpur R. Mukund, Jan Kolnik, Ken Paradis, Steve Howard, Jeff Burleson
    A universal common-source and common-drain model for 1-20GHz frequency range. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  9. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
    Towards Fault-Tolerant RF Front Ends. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:371-386 [Journal]

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