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Publications of Author

1. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
   Dynamic Input Match Correction in RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
   DFT, 2004, pp:211-219 [Conf]
   
2. Sripriya R. Bandi, Clyde Washburn, P. R. Mukund, Jan Kolnik, Minxuan Liu, Ken Paradis, Steve Howard, Jeff Burleson
   Accurate performance prediction of multi-GHz CML with data run-length variations. [Citation Graph (0, 0)][DBLP]
   ISCAS (5), 2005, pp:5103-5106 [Conf]
   
3. Anand Gopalan, Tejasvi Das, Clyde Washburn, Ponnathpur R. Mukund
   Use of source degeneration for non-intrusive BIST of RF front-end circuits. [Citation Graph (0, 0)][DBLP]
   ISCAS (5), 2005, pp:4385-4388 [Conf]
   
4. Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson
   Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2005, pp:295-300 [Conf]
   
5. Anand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund
   An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2005, pp:485-490 [Conf]
   
6. Ghanshyam Nayak, Clyde Washburn, P. R. Mukund
   System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2005, pp:878-881 [Conf]
   
7. Mark Pude, Clyde Washburn, Ponnathpur R. Mukund, Kouichi Abe, Yoshinori Nishi
   An analytical propagation delay model with power supply noise effects. [Citation Graph (0, 0)][DBLP]
   ISCAS, 2006, pp:- [Conf]
   
8. S. Sridharan, Sripriya R. Bandi, Clyde Washburn, Ponnathpur R. Mukund, Jan Kolnik, Ken Paradis, Steve Howard, Jeff Burleson
   A universal common-source and common-drain model for 1-20GHz frequency range. [Citation Graph (0, 0)][DBLP]
   ISCAS, 2006, pp:- [Conf]
   
9. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
   Towards Fault-Tolerant RF Front Ends. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:4-6, pp:371-386 [Journal]