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Publications of Author

1. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
   Dynamic Input Match Correction in RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
   DFT, 2004, pp:211-219 [Conf]
   
2. Sripriya R. Bandi, Clyde Washburn, P. R. Mukund, Jan Kolnik, Minxuan Liu, Ken Paradis, Steve Howard, Jeff Burleson
   Accurate performance prediction of multi-GHz CML with data run-length variations. [Citation Graph (0, 0)][DBLP]
   ISCAS (5), 2005, pp:5103-5106 [Conf]
   
3. P. R. Mukund, V. Mukund, Charles E. Noon
   Signal Routing with Temporal Constraints. [Citation Graph (0, 0)][DBLP]
   ISCAS, 1993, pp:1479-1482 [Conf]
   
4. Rajesh Narasimha, S. B. Rachaiah, Raghuveer M. Rao, P. R. Mukund
   1/f noise modeling using discrete-time self-similar systems. [Citation Graph (0, 0)][DBLP]
   ISCAS (4), 2003, pp:596-599 [Conf]
   
5. S. Sridharan, Ghanshyam Nayak, P. R. Mukund
   LNA design optimization with reference to ESD protection circuitry. [Citation Graph (0, 0)][DBLP]
   ISCAS (1), 2003, pp:205-208 [Conf]
   
6. Ghanshyam Nayak, Tejasvi Das, T. M. Rao, P. R. Mukund
   DREAM: A Chip-Package Co-Design Tool for RF-Mixed Signal Systems. [Citation Graph (0, 0)][DBLP]
   ISVLSI, 2004, pp:207-210 [Conf]
   
7. M. Benmansour, P. R. Mukund
   A Tuned Wideband LNA in 0.25?I`m IBM Process For RF Communication Applications. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2004, pp:631-634 [Conf]
   
8. Tejasvi Das, P. R. Mukund
   A Low Noise Current-mode Readout circuit for CMOS Image Sensing Applications. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2004, pp:635-638 [Conf]
   
9. Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson
   Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2005, pp:295-300 [Conf]
   
10. George A. Hadgis, P. R. Mukund
    A novel CMOS monolithic analog multiplier with wide input dynamic range. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1995, pp:310-314 [Conf]
    
11. Anand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund
    An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:485-490 [Conf]
    
12. Ghanshyam Nayak, P. R. Mukund
    Chip Package Co-Design of a Heterogeneously Integrated 2.45GHz CMOS VCO using Embedded Passives in a Silicon Package. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:627-630 [Conf]
    
13. Ghanshyam Nayak, Clyde Washburn, P. R. Mukund
    System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:878-881 [Conf]
    
14. Antonija Soldo, Anand Gopalan, P. R. Mukund, Martin Margala
    A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:1023-1026 [Conf]
    
15. P. R. Mukund, J. F. McDonald
    MCM: The High-Performance Electronic Packaging Technology. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1993, v:26, n:4, pp:10-12 [Journal]
    
16. Anand Gopalan, Martin Margala, P. R. Mukund
    A current based self-test methodology for RF front-end circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1091-1102 [Journal]
    
17. Tejasvi Das, P. R. Mukund
    Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:1277-1282 [Conf]
    
18. Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund
    Towards Fault-Tolerant RF Front Ends. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:371-386 [Journal]