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Charles F. Hawkins: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
    A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:267-0 [Conf]
  2. Ali Keshavarzi, Siva Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De
    Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. [Citation Graph (0, 0)][DBLP]
    ISLPED, 1999, pp:252-254 [Conf]
  3. B. Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
    Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:947-953 [Conf]
  4. Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
    Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:23-31 [Conf]
  5. Charles F. Hawkins
    System Testing: The Future for All of Us. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:548- [Conf]
  6. Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
    Defect Classes - An Overdue Paradigm for CMOS IC. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:413-425 [Conf]
  7. Charles F. Hawkins, Richard H. Williams
    EE Curriculum - Continuous Process Improvement? [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:1118- [Conf]
  8. Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
    The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:302-310 [Conf]
  9. Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins
    Economic Impact of Type I Test Errors at System and Board Levels. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:444-452 [Conf]
  10. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
    Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:146-155 [Conf]
  11. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, K. Soumyanath, Vivek De
    Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:1051-1059 [Conf]
  12. Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
    CMOS IC reliability indicators and burn-in economics. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:194-203 [Conf]
  13. Jaume Segura, Carol de Benito, A. Rubio, Charles F. Hawkins
    A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:544-551 [Conf]
  14. Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
    Parametric Failures in CMOS ICs - A Defect-Based Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:90-99 [Conf]
  15. Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
    Burn-in Temperature Projections for Deep Sub-micron Technologies. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:95-104 [Conf]
  16. Jerry M. Soden, Charles F. Hawkins
    Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:544-557 [Conf]
  17. Jerry M. Soden, Charles F. Hawkins
    Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:443-451 [Conf]
  18. Jerry M. Soden, Charles F. Hawkins
    Quality Testing Requires Quality Thinking. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:596- [Conf]
  19. Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
    CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:423-430 [Conf]
  20. Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins
    A General Purpose IDDQ Measurement Circuit. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:642-651 [Conf]
  21. Richard H. Williams, Charles F. Hawkins
    The Economics of Guardband Placement. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:218-225 [Conf]
  22. Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins
    Testing Errors: Data and Calculations in an IC Manufacturing Process. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:352-361 [Conf]
  23. I. de Paúl, M. Rosales, B. Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
    Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:286-291 [Conf]
  24. Charles F. Hawkins, Jerry M. Soden
    IDDQ Design and Test Advantages Propel Industry. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:40-41 [Journal]
  25. Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
    Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:36-43 [Journal]
  26. Charles F. Hawkins, Jaume Segura
    Test and Reliability: Partners in IC Manufacturing, Part 1. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:3, pp:64-71 [Journal]
  27. Charles F. Hawkins, Jerry M. Soden
    Deep Submicron CMOS Current IC Testing: Is There a Future? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:14-15 [Journal]
  28. Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
    Test and Reliability: Partners in IC Manufacturing, Part 2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:66-73 [Journal]
  29. Jerry M. Soden, Charles F. Hawkins
    IDDQ Testing: Issues Present and Future. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:4, pp:61-65 [Journal]
  30. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
    Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2000, v:8, n:6, pp:717-723 [Journal]
  31. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De
    Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2003, v:11, n:5, pp:863-870 [Journal]

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