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Farzin Karimi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Farzin Karimi, Fabrizio Lombardi
    Parallel Testing of Multi-port Static Random Access Memories for BIST. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:271-279 [Conf]
  2. Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi
    Data Compression for System-on-Chip Testing Using ATE. [Citation Graph (0, 0)][DBLP]
    DFT, 2002, pp:166-176 [Conf]
  3. Farzin Karimi, Fabrizio Lombardi
    A Scan-Bist Environment for Testing Embedded Memories. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:211-0 [Conf]
  4. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
    Hybrid Multisite Testing at Manufacturing. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:927-936 [Conf]
  5. Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
    Random Testing of Multi-Port Static Random Access Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2002, pp:101-108 [Conf]
  6. Farzin Karimi, Fabrizio Lombardi
    A Scan-Bist Environment for Testing Embedded Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2002, pp:17-0 [Conf]
  7. Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby
    A Parallel Approach for Testing Multi-Port Static Random Access Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2001, pp:73-0 [Conf]
  8. Wenyi Feng, Farzin Karimi, Fabrizio Lombardi
    Fault Detection in a Tristate System Environment. [Citation Graph (0, 0)][DBLP]
    IEEE Micro, 2001, v:21, n:5, pp:77-85 [Journal]
  9. Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi
    Parallel testing of multi-port static random access memories. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:1, pp:3-21 [Journal]

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