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Publications of Author

1. Farzin Karimi, Fabrizio Lombardi
   Parallel Testing of Multi-port Static Random Access Memories for BIST. [Citation Graph (0, 0)][DBLP]
   DFT, 2001, pp:271-279 [Conf]
   
2. Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi
   Data Compression for System-on-Chip Testing Using ATE. [Citation Graph (0, 0)][DBLP]
   DFT, 2002, pp:166-176 [Conf]
   
3. Farzin Karimi, Fabrizio Lombardi
   A Scan-Bist Environment for Testing Embedded Memories. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2002, pp:211-0 [Conf]
   
4. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
   Hybrid Multisite Testing at Manufacturing. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:927-936 [Conf]
   
5. Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
   Random Testing of Multi-Port Static Random Access Memories. [Citation Graph (0, 0)][DBLP]
   MTDT, 2002, pp:101-108 [Conf]
   
6. Farzin Karimi, Fabrizio Lombardi
   A Scan-Bist Environment for Testing Embedded Memories. [Citation Graph (0, 0)][DBLP]
   MTDT, 2002, pp:17-0 [Conf]
   
7. Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby
   A Parallel Approach for Testing Multi-Port Static Random Access Memories. [Citation Graph (0, 0)][DBLP]
   MTDT, 2001, pp:73-0 [Conf]
   
8. Wenyi Feng, Farzin Karimi, Fabrizio Lombardi
   Fault Detection in a Tristate System Environment. [Citation Graph (0, 0)][DBLP]
   IEEE Micro, 2001, v:21, n:5, pp:77-85 [Journal]
   
9. Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi
   Parallel testing of multi-port static random access memories. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:3-21 [Journal]